V8000
LSI Logic Test System
New frontiers with a test rate of 20MHz
V8000 flexibly assists developing high value-added LSIs in the 20MHz range, reducing the distance from your new ideas to the market.
[Features]
･20MHz test rate
･256 I/O pins at a maximum
･8 DUTs measurable simultaneously at a maximum (Optional SPMU cuts testing time)
･Upward compatibility with V800, V777, V7100
| Maximum Pin Count | 256 I/O pins |
|---|---|
| Simultaneous Measurement | up to 8 LSI chips (32pins/DUT) |
| Test Items | Function measurement (optional IDDQ measurement unit) DC parametric measurement (Voltage-impressed current measurement/ Current-impressed voltage measurement) |
| Main body size/weight | 730Wx813Hx1010D (mm)･ 200kg |
| Test head size/weight | 495.2Wx315.7Hx720D (mm)･ 50kg |
[Production screen]
